ECONOMIC GEOLOGY AND MINERALOGY

 

Bentonite clay from Patagonia (SEM image)

Contacts for booking
XRD. G. Grathoff.
Tel. ++49(0)3834 86 4584. E-mail: grathoff@uni-greifswald.de.
SEM/TEM. M. Zander.
Tel. ++49(0)3834 86 4581. E-mail: zander@uni-greifswald.de.
General enquires. L.N. Warr.
Tel. ++49(0)3834 86 4578. E-mail: warr@uni-greifswald.de.
General enquires. R. Martens.
Secretary. Tel. ++49(0)3834 86 4570. E-mail: geologie@uni-greifswald.de

 

 

Mineralogical Laboratories
Institut für Geographie und Geologie
Ernst Moritz Arndt Universität Greifswald
F.L. Jahnstr. 17a
D-17487 Greifswald
Germany

Concept
Our claylab houses a series of high resolution tools for studying the crystal-chemistry of fine-grained materials. Our prime techniques involve combining X-ray diffraction, and electron microscopy (scanning and transmission modes) for characterizing and monitoring fine particle mineral reactions in various geological and geotechnical settings. A summary of our analytical instruments is listed as follows:

Bruker D5000 X-ray diffractometer (with x 40 sample changer)
Bruker D8 Advance X-ray diffractometer with reaction chambers
JEOL JIB high resolution transmission electron microscope (HRTEM)
JEOL Scanning electron microscope (SEM)
Zeiss Auriga Crossbeam microscope (FIB-SEM) coming in March 2011
Differential thermal analyses (TG-DTA)


HRTEM image of a deformed chlorite crystal lattice from the Alpine Fault, NZ

     

X-ray diffraction

Bruker D8 Advance X-ray diffractometer equipped with
Humidity chamber
High temperature reaction chamber
Wet-cell XRD cells

Bruker D5000 X-ray diffractometer
x40 sample changer
Cu radiation tube

 

High-resolution transmission electron microscopy

JEOL JEM 1210
High resolution transmission electron microscope
Oxford instruments EDX (30mm2 SiLi detector)
Selective electron diffraction analyses
Gatan CCD camera system

     

Preparation facilities

Eppendorf centrifuge 5810 R

 

Heraeus flow through centrifuge 17RS

Scanning electron microscopy

JEOL JXA 840A Scanning electron microscope

Secondary electron detector
EDX analyses
Oxford Instruments cryotransfer system

     

Differential thermal analyses (TG-DTA)

Thermoanalysesystem SETARAM TGA 92 (TG, DTA, DSC)
upto 1600 °C
air and inert gas

 

Focused ion beam - electron microscopy (crossbeam)

Zeiss Auriga Crossbeam microscope

Cryostat
manipulator
Secondary electron detector
EsB backscatter electron detector
EBSD Oxford instruments detector
INCA EDX analyses (with 80mm2 Oxford instruments detector)